...
Detailed As-Is Process.
Attribute & Variable Data.
Stratification.
Summarization of Data (Pie-chart, Scatter-plot, Dot-plot, Box-Whisker plot, Stratification, Histograms etc.).
Central Tendency, Spread & Location of Variable Data.
Defects & Defectives, Specification & Defect Definition.
Data collection plan (optimum sample size).
Sampling.
Types of sampling (Random, Stratified etc.).
Measurement system validation.
Gauge Repeatability & Reproducibility.
Gauge Accuracy & Precision.
GRR Study (Average-Range method & ANOVA method).
Baseline.
DPU, DPO, DPMO & Sigma Level.
Process Shift.
Process Capability Study (the short term & long term process capability metrics).
The advantages & disadvantages of the process capability metrics.
The relationship of process capability metrics and sigma level.
... |